NIDEK Autorefraktometer-Keratometer ARK-560A
$4,750.00
$4,750.00
The NIDEK ARK-560A / 530A / 510A adopts the advanced Pupil
Zone Imaging Method for refraction measurement, which
analyzes a wider area (Max. ΓΈ4 mm) to obtain more reliable and
realistic data that is closer to subjective refraction.
The ARK-560A / 530A / 510A uses the SLD (Super Luminescent
Diode) and highly sensitive CCD device for improved image
quality. The image with the SLD is sharper and clearer than
those with the LED, and the system offers greatly improved
measurement capability even with dense cataract and IOL
implanted eyes.
Zone Imaging Method for refraction measurement, which
analyzes a wider area (Max. ΓΈ4 mm) to obtain more reliable and
realistic data that is closer to subjective refraction.
The ARK-560A / 530A / 510A uses the SLD (Super Luminescent
Diode) and highly sensitive CCD device for improved image
quality. The image with the SLD is sharper and clearer than
those with the LED, and the system offers greatly improved
measurement capability even with dense cataract and IOL
implanted eyes.
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